VonGraevenitz Wagner Harhoff (2011) - How To Measure Patent Thickets A Novel Approach

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Reference

• Von Graevenitz, G., Wagner, S. and Harhoff, D. (2011), "How to measure patent thickets -; A novel approach", Economics Letters, Vol.111, No.1, pp.6--9

@article{von2011measure,
  title={How to measure patent thickets -- A novel approach},
  author={Von Graevenitz, G. and Wagner, S. and Harhoff, D.},
  journal={Economics Letters},
  volume={111},
  number={1},
  pages={6--9},
  year={2011},
  abstract={This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.},
  discipline={Econ},
  research_type={Measures},
  industry={},
  thicket_stance={},
  thicket_stance_extract={},
  thicket_def={},
  thicket_def_extract={},  
  tags={},
  filename={VonGraevenitz Wagner Harhoff (2011) - How To Measure Patent Thickets  A Novel Approach.pdf}
}

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Abstract

This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.