Difference between revisions of "Hall (2005) - A Note On The Bias In Herfindahl Type Measures Based On Count Data"
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|Has page=Hall (2005) - A Note On The Bias In Herfindahl Type Measures Based On Count Data | |Has page=Hall (2005) - A Note On The Bias In Herfindahl Type Measures Based On Count Data | ||
|Has title=A Note On The Bias In Herfindahl Type Measures Based On Count Data | |Has title=A Note On The Bias In Herfindahl Type Measures Based On Count Data | ||
| − | |Has author= | + | |Has author=Hall |
|Has year=2005 | |Has year=2005 | ||
|In journal= | |In journal= | ||
Revision as of 12:22, 29 September 2020
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| Has author | Hall |
| Has year | 2005 |
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Reference
- Hall, B.H. (2005), "A note on the bias in Herfindahl-type measures based on count data", Revue D' Economie Industrielle, Paris Editions, Techniques Et Economiques, Vol.110, pp.149
@article{hall2005note,
title={A note on the bias in Herfindahl-type measures based on count data},
author={Hall, B.H.},
journal={Revue D' Economie Industrielle, Paris Editions, Techniques Et Economiques},
volume={110},
pages={149},
year={2005},
abstract={A Herfindahl index of constructed from shares based on count data where the number of counts is small will generally be biased downward because of the statistical properties of count data and Jensens inequality. This note suggests a simple correction for the bias and illustrates its applicability when using measures based on patent data and patent citation data.},
discipline={Econ},
research_type={Measures},
industry={},
thicket_stance={},
thicket_stance_extract={},
thicket_def={},
thicket_def_extract={},
tags={},
filename={Hall (2005) - A Note On The Bias In Herfindahl Type Measures Based On Count Data.pdf}
}
File(s)
Abstract
A Herfindahl index of constructed from shares based on count data where the number of counts is small will generally be biased downward because of the statistical properties of count data and Jensens inequality. This note suggests a simple correction for the bias and illustrates its applicability when using measures based on patent data and patent citation data.
